Back To Schedule
Tuesday, December 9 • 10:30am - 12:30pm
PAP-23: IEC 61850 Test Profile

Sign up or log in to save this to your schedule, view media, leave feedback and see who's attending!

Chair: Erich Gunther. PAP-23: IEC 61850 testing profiles will hold a working meeting to continue the technical work of the group that is underway. A brief introduction will be provided at the start of the session for new attendees to help encourage their engagement and participation moving forward. The main focus of the meeting will be in the review and update of the preliminary Basic Application Profile (BAP) template that has been created along with the high level requirements for distribution feeder measurement.

Tuesday December 9, 2014 10:30am - 12:30pm PST

Attendees (0)